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Year: 2019

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Type: Article

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Title: Determination Method for Interface State Densities Adapted to Ultrathin Dielectrics

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Author: Novkovski, N.
Author: Skeparovski, A.

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Abstract:

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Publisher: IEEE

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Relation: 2019 IEEE 31st International Conference on Microelectronics (MIEL)

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Identifier: oai:repository.ukim.mk:20.500.12188/10984
Identifier: http://hdl.handle.net/20.500.12188/10984
Identifier: 10.1109/miel.2019.8889574
Identifier: http://xplorestaging.ieee.org/ielx7/8883095/8889568/08889574.pdf?arnumber=8889574

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